Test Generation of Crosstalk Delay Faults in VLSI Circuits
Jayanthy, S. - Personal Name
Bhuvaneswari, M.C. - Personal Name
Catatan
Ketersediaan
| EB001495 | EB 621.319 JAY t | My Library | Tersedia |
Informasi Detil
| Judul Seri | - |
| No. Panggil | EB 621.319 JAY t |
| Penerbit | Springer : Singapore., 2019 |
| Deskripsi Fisik | xi, 155 hal.: il. |
| Bahasa | English |
| ISBN/ISSN | 978-981-13-2493-2 |
| Klasifikasi | 621.319 |
| Tipe Isi | - |
| Tipe Media | - |
| Tipe Pembawa | - |
| Edisi | - |
| Subyek | Integrated Circuit Technology |
| Info Detil Spesifik | - |
| Pernyataan Tanggungjawab | S. Jayanthy; M.C. Bhuvaneswari |
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